Author Topic: EPMA Events (Meetings, Workshops, Seminars...)  (Read 20547 times)

Donggao Zhao

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Re: EPMA Events (Meetings, Workshops, Seminars...)
« Reply #15 on: July 29, 2015, 01:37:26 pm »
EPMA and SEM Short Course and Symposium at Nanjing University, December 15 to 19, 2014

A successful week long EPMA and SEM Short Course and Symposium was held at Nanjing University’s Xianlin Campus, Nanjing, China from December 15 to 19, 2014 (http://es.nju.edu.cn/zh-cn/NewDetail.aspx?ContentID=20141231-10242431~31511e85).

This short course admitted 28 participants among more than 90 people from universities, research institutes, and industries in China who would like to participate in this event. Considering effectiveness of afternoon lab demo sessions, maximum number of participants was initially set to 20. JEOL, Carl Zeiss, Oxford Instruments, Gatan, Zhongjingkeyi Technology Co., Ltd., etc. supported this short course and symposium. MAS member Dr. Donggao Zhao of the University of Texas at Austin was invited to be a lecturer for the short course.

Nanjing University intends to continue this annual EPMA and SEM short course and symposium in December of 2015.

John Donovan

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Re: EPMA Events (Meetings, Workshops, Seminars...)
« Reply #16 on: August 02, 2015, 08:45:06 am »
Probe Software will exhibiting at Microscopy & Microanalysis 2015 this summer in Portland, Oregon, August 2nd through 6th. See how our software methods and features can improve accuracy and save time for your EPMA lab!

M&M Tutorials 5:45 PM to 6:45 PM (17:45 to 18:45)

Monday- Julien Allaz: "Easy Acquisition and High Accuracy Quantitative Analysis in Probe for EPMA"
Tuesday- Karsten Goemann: "Multi-Point and Shared Backgrounds- Ultimate EPMA Accuracy for Traces in Complex Matrices"
Wednesday- John Donovan: "Fast and Easy Quantitative X-ray Mapping and Image Processing for EPMA"
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Probeman

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Re: EPMA Events (Meetings, Workshops, Seminars...)
« Reply #17 on: August 06, 2015, 09:58:53 pm »
EPMA 2016
MAY 17‐19, 2016
University of Wisconsin
Madison, WI

http://www.microbeamanalysis.org/topical-conferences/epma-2016-1/epma-2016

Paul Carpenter: paul.carpenter.epma@gmail.com
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Probeman

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Re: EPMA Events (Meetings, Workshops, Seminars...)
« Reply #18 on: December 09, 2015, 09:50:40 am »
Golden Software is a seminar in Golden, Colorado at the Colorado School of Mines on their Surfer plotting product, Thursday January 7th 2016 for those that are interested:

http://www.goldensoftware.com/trainingclass?utm_source=Reminder&utm_medium=Email&utm_content=RegisterToday_users&utm_campaign=TrainingClass

This is the product (along with Grapher) that we utilize for rapid scripting of mapping results as described here:

http://probesoftware.com/smf/index.php?topic=73.msg544#msg544
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Probeman

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Re: EPMA Events (Meetings, Workshops, Seminars...)
« Reply #19 on: December 15, 2015, 12:20:30 pm »
Golden Software is a seminar in Golden, Colorado at the Colorado School of Mines on their Surfer plotting product, Thursday January 7th 2016 for those that are interested:

http://www.goldensoftware.com/trainingclass?utm_source=Reminder&utm_medium=Email&utm_content=RegisterToday_users&utm_campaign=TrainingClass

This is the product (along with Grapher) that we utilize for rapid scripting of mapping results as described here:

http://probesoftware.com/smf/index.php?topic=73.msg544#msg544

Golden Software is now offering this Surfer training class on-line for those that cannot get to Golden, Colorado in person next month:

http://www.goldensoftware.com/trainingclass
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Heather Lowers

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Re: EPMA Events (Meetings, Workshops, Seminars...)
« Reply #20 on: January 19, 2016, 10:18:22 am »
I would like to direct everyone's attention to the upcoming Topical Conference on Electron Probe MicroAnalysis (EPMA - TC)!

http://www.microprobe.org/topical-conferences/epma-2016-1/epma-2016

This 4-day event will take place May 16-19 in Madison and will consist of user meetings on the first day and then three days of tutorials, topical discussions and poster sessions.

The meeting is aimed at experienced SEM / EPMA users as well as people new to quantitative analysis by EPMA (WDS) or SEM (EDS). It will be a great opportunity to meet people, learn, discuss applications and ask many questions. More details below.

There will be support available for students and 'early career scholars'.  See attachment for funding program details.

Registration is now open. Please, mark the following dates in your calendars!

- Deadline for submission of abstracts is February 15, 2016.
- Deadline for submission of posters is March 1, 2016.
- Deadline for application for MAS Early Career Scholar support is March 1, 2016.




Probeman

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Re: EPMA Events (Meetings, Workshops, Seminars...)
« Reply #21 on: January 25, 2016, 02:35:32 pm »
This is from an email from Julien Allaz:

Please, consider submitting an abstract before February 8th to…

Session A08: Quantitative and qualitative microanalysis by EPMA and SEM

=> http://www.microscopy.org/MandM/2016/program/submit.cfm

This session will cover advances in quantitative and qualitative microanalysis by EPMA and SEM using WDS and EDS detector systems, trace and light element microanalysis, complementary techniques applied to compositional mapping, the role of standard reference materials, and educational efforts directed toward improvements in microanalysis. We welcome contributed presentations from the scientific and vendor communities, and will highlight the efforts of young scientists and the role of education.

Invited speakers:
- Stuart Kearns (University of Bristol, UK)
- Ed Vicenzi (Smithsonian Institution)
- Dale Newbury (NIST)
- John T. Armstrong (Carnegie Institution for Science)
- Anette von der Handt (University of Minnesota)

Looking forward to see you in Columbus!
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Probeman

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Re: EPMA Events (Meetings, Workshops, Seminars...)
« Reply #22 on: April 20, 2016, 08:56:27 am »
Back by popular demand, two new hands-on Surfer training classes are scheduled in May!

Learn all about Surfer's powerful capabilities in the Surfer Core Features I class. This day long class will show you how to quickly go from raw data to visual model. The class will dive into data gridding techniques and how to create and customize popular map-types.

    When: Thursday, May 12th, 9am to 4pm Mountain Daylight Saving Time
    Where: Online format

http://www.goldensoftware.com/trainingclass?utm_source=May_Surfer&utm_medium=Email&utm_content=CoreFeaturesI&utm_campaign=TrainingClass#Surfer

Want to take your current Surfer skills to the next level? Sign up for the Surfer Core Features II class which builds upon the skills reviewed in Core Features I. Additionally, Core Features II will cover advanced grid operations, coordinate conversion, and other more in-depth Surfer features. The completion of Core Features I is not required for attendance at Core Features II.

    When: Wednesday, May 25th, 10am to 2pm Mountain Daylight Saving Time
    Where: Online format

http://www.goldensoftware.com/trainingclass?utm_source=May_Surfer&utm_medium=Email&utm_content=CoreFeaturesII&utm_campaign=TrainingClass#SurferCoreII

Hurry, sign up for either class by April 30th and receive 10% off with coupon code SRFR10.

Let me know if you have any questions.

Sincerely,
Emily Stewart
Training Coordinator
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John Donovan

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Re: EPMA Events (Meetings, Workshops, Seminars...)
« Reply #23 on: May 04, 2016, 07:31:32 am »
We hope to see you all at the EPMA 2016 topical conference next month in Madison, Wisconsin. It should be lots of fun.  On Monday the 16th, Probe Software will host a user meeting in the afternoon and all JEOL and Cameca users are welcome to attend, but please send an email to Barbara, barbara@probesoftware.com, if you plan to attend so she has an idea of how many snacks to get for everyone!

John will give a short intro on what's new in Probe Software, and then we will have a number of very short (5 min) presentations from a few of our experts to stimulate discussion:

1. Mike Jercinovic: Using PictureSnap to obtain representative analyses
2. Dan Ruscitto: Microanalytical Challenges for Hydrous Glasses
3. Phil Gopon: Using non-traditional x-ray lines for nano-quantification
4. Anette von der Handt: Quantification and Output of X-ray Maps
5. Karsten Goemann: Using shared backgrounds for complex mineral analysis

See you all soon!
John J. Donovan, Pres. 
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John Donovan

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Re: EPMA Events (Meetings, Workshops, Seminars...)
« Reply #24 on: May 14, 2016, 07:16:27 pm »
We hope to see you all at the EPMA 2016 topical conference next month in Madison, Wisconsin. It should be lots of fun.  On Monday the 16th, Probe Software will host a user meeting in the afternoon and all JEOL and Cameca users are welcome to attend, but please send an email to Barbara, barbara@probesoftware.com, if you plan to attend so she has an idea of how many snacks to get for everyone!

John will give a short intro on what's new in Probe Software, and then we will have a number of very short (5 min) presentations from a few of our experts to stimulate discussion:

1. Mike Jercinovic: Using PictureSnap to obtain representative analyses
2. Dan Ruscitto: Microanalytical Challenges for Hydrous Glasses
3. Phil Gopon: Using non-traditional x-ray lines for nano-quantification
4. Anette von der Handt: Quantification and Output of X-ray Maps
5. Karsten Goemann: Using shared backgrounds for complex mineral analysis

See you all soon!

The Probe Software user meeting will be in the Union Hotel (same as the other vendor meetings), 3rd floor in the Industry room at 3:30.
« Last Edit: May 14, 2016, 07:25:41 pm by John Donovan »
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John Donovan

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Re: EPMA Events (Meetings, Workshops, Seminars...)
« Reply #25 on: May 29, 2016, 06:23:39 am »
What a great meeting! 

The EPMA 2016 in Madison, WI last week was a resounding success and I personally want to thank the organizers.

The Probe Software user meeting was a particular success, drawing over 70 attendees (they had to get us a larger room!).

Lots of information was presented by the presenters (see previous post) and there was a lively discussion on many topics.

Just FYI: at the Cameca user meeting earlier in the day it was announced that Cameca and Probe Software have signed a formal agreement allowing Cameca to re-sell Probe for EPMA and Probe Image on their new instrument sales.

Thank-you to all the attendees.
« Last Edit: May 29, 2016, 09:41:26 am by John Donovan »
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Probeman

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Re: EPMA Events (Meetings, Workshops, Seminars...)
« Reply #26 on: August 01, 2016, 12:39:15 pm »
I wasn't able to attend this years M&M in Columbus, but please allow me to congratulate Mike Jercinovic here on his Presidential Science Award!

https://www.umass.edu/newsoffice/article/jercinovic-honored-microanalysis-society

Mike most certainly deserves this award given his many contributions to trace element precision and accuracy in EPMA!
john
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Philipp Poeml

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Re: EPMA Events (Meetings, Workshops, Seminars...)
« Reply #27 on: December 07, 2016, 06:22:35 am »
EMAS 2017 and IUMAS-7 in Konstanz, Germany, May 7-11 2017

Dear colleagues,

(apologies for cross-posting)

If you haven't already done so, please consider joining us for EMAS 2017 - 15th European Workshop on Modern Developments and Applications in Microbeam Analysis and IUMAS-7 Meeting at the Bodensee in Konstanz, Germany from May 7th to 11th 2017.

Early bird registration for this event ends on March 15th 2017. The deadline for abstract submissions is February 28th 2017.

All details and on-line registration/abstract submission are available at:

http://www.microbeamanalysis.eu/

Best wishes
Philipp

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Re: EPMA Events (Meetings, Workshops, Seminars...)
« Reply #28 on: December 07, 2016, 12:04:20 pm »
Apologies for "tooting my own horn", but just wanted to let anyone going to AGU next week in San Francisco know, that I am presenting on Tuesday, at 4:45 PM (not quite the last talk of the day!). Details here:

Abstract ID and Title: 122997: Improving Precision, Maintaining Accuracy, and Reducing Acquisition Time for Trace Elements in EPMA
Final Paper Number: V24C-04
Presentation Type: Oral
Session Date and Time: Tuesday, 13 December 2016; 16:00 - 18:00
Presentation Length: 16:45 - 17:00
Session Number and Title: V24C: New Insights on Igneous and Metamorphic Processes from Nontraditional Thermobarometers and Geospeedometers I
Location: Moscone South; 305

Hope to see you all there!
john
« Last Edit: December 07, 2016, 09:02:13 pm by Probeman »
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Owen Neill

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Re: EPMA Events (Meetings, Workshops, Seminars...)
« Reply #29 on: January 19, 2017, 01:23:31 pm »
Dear colleagues,

Apologies for the cross-postings, but I hope you all had a safe and relaxing holiday, and that 2017 is off to a good start for everyone. Paper submission for the Microscopy and Microanalysis 2017 Annual Meeting (St. Louis, MO, 6-10 August, 2017) is now open, and will close on 15 February. My co-conveners and I would like to draw your attention to:
 
Symposium A09, Standards, Reference Materials, and Their Applications in Quantitative Microanalysis.
 
We are looking for submissions dealing with the synthesis, evaluation, and need for new reference materials; evaluation, distribution, and maintenance of existing reference materials; the use of standards in quantitative microanalysis; and the application of quantitative microanalytical techniques to solving analytical problems. A full description of this session is included below. Papers may be submitted via the M&M2017 website: http://www.microscopy.org/mandm/2017/
 
We are also pleased to announce the invited speakers for this symposium:
 
John Hanchar, Department of Earth Sciences, Memorial University, Newfoundland
William Nachlas, Department of Earth Sciences, Syracuse University
Timothy Rose, Department of Mineral Sciences, Smithsonian Institution
Stephen Wilson, Reference Materials Program, United States Geological Survey
 
We are very excited to hear from these experts in microanalytical standards and quantitative microanalysis, and we look forward to hearing about your work as well. See you in St. Louis!
 
The organizers of Symposium A09:
Julien Allaz, University of Colorado – Boulder
Anette von der Handt, University of Minnesota – Twin Cities
Owen Neill, Washington State University
 
 
Symposium Description:
Standards and reference materials are essential for obtaining accurate quantitative compositional data from X-ray microanalysis by EPMA or SEM (WDS/EDS), as well as from other microanalytical techniques (LA-ICP-MS, SIMS, µ-XRF, FTIR, Raman spectroscopy, etc.). These materials must be rigorously evaluated for their reference compositions and homogeneity, must be widely available to the analytical community, and must be properly maintained to avoid contamination or deterioration. We welcome contributions on the synthesis, evaluation, distribution, and maintenance of standards and reference materials, as well as their appropriate use in microanalysis. We further encourage submissions on standard-based applications of quantitative microanalysis, or on the development of new quantitative microanalytical protocols.

Topics of interest include:
•           The use of standards and reference materials in quantitative microanalysis, and the needs of the analytical community for improving such materials.
•           Synthesis, evaluation, distribution, and maintenance of standards and reference materials.
•           Development of new protocols for microanalytical techniques.
•           Applications of standard-based techniques to solving microanalytical problems.