Author Topic: Hidden features in Probe Image  (Read 1760 times)

John Donovan

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Hidden features in Probe Image
« on: June 01, 2017, 01:22:07 pm »
Probe Image is very easy to use, so there really aren't many "hidden features" in there.

So this is a small thing but it is really nice for setting up x-ray maps when acquiring multiple spectrometer passes because you are quantifying more elements than you have spectrometers.

For example you might want to first map: Si, Fe, Mg, Na, K on the first acquisition, and then on the second map acquisition you might want to map: Ti, Mn, F, Cl, Ca.  Of course this can be repeated for more elements.

So when you're setting up multiple spectrometer passes you will have a PFE probe run already, so with that file open go to the Acquire! window and click on the Peaking Options button.  You will see this dialog, and please note the controls outlined in red:

Using this dropdown list and the button you can have PFE move to each spectrometer pass based on the element order on that spectrometer.

Then in Probe Image one simply clicks the ELM All button to read in these elements, x-rays, peak positions, PHA  values, and off-peak offsets (if needed) as seen here:

Next create another sample setup in PI (using the Insert After button), using the same sample name and again from PFE click the button to move to the 2nd pass elements as seen here:

Then with the 2nd sample selected in PI, again click the ELM All button to read in these 2nd pass elements as seen here:

Easy as pie!   This process can be repeated if necessary for additional (3rd or 4th mapping pass) elements.
« Last Edit: April 12, 2020, 09:56:35 pm by John Donovan »
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