Hi an update on using PCC combined conditions for Jeol 8530F. Thanks to John's hard work this now works really well.
Here's a brief outline on what I do and the nature of the problem
I run major elements at say 20nA and trace elements at 200nA. When switching from 20nA to 200nA the beam goes out of focus and becomes stigmatic. It also shifts position. Now using PCC this can be corrected for - allowing high spatial resolution dual conditions. It corrects for beam shift using image shift - and needs the beam to be in scanning mode - but this can be at 300,000 mag.
Part one - setup PCC files
(1) Set up column for major elements - 20kV, 20nA,x300000mag, good focus and stigma.
(2) Using Window menu in main window - select "Save PCC"
(2) Find a feature and put it in the middle of the field of view
(3) Set up column for minor elements - 20kV, 200nA, good focus and stigma.
(4) Check the shift from the feature. - how much shift in x and y
(5) In Analytical conditions (read conditions if necessary) and choice beam scan mode - enter required x and y shift.
(6) Press ok to apply to column - check if the amount of shift is correct to return the feature to the middle of the field of view. If not repeat step (5)
(7) Set mag to 300,000 and Using Window menu in main window - select "Save PCC"
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![Cool 8)](https://probesoftware.com/smf/Smileys/default/cool.gif)
Load each PCC file - Window menu "Load PCC.." check focus, image shift is correct - otherwise correct and resave PCC files.
Part Two - set up combined conditions
In Combined Conditions window (from Analzye window). For each element select the required PCC file. Then your ready to go!
In combined conditions you can have some elements using PCC file and some elements using anaytical conditions - giving flexiblity.
The PCC files are good in that they load very quickly onto the column - no need to iterate beam current - giving rapid beam condition changes
Ben