Author Topic: Probe Software Company and Product Information  (Read 12021 times)

Mike Matthews

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Re: Probe Software Company and Product Information
« Reply #15 on: February 25, 2023, 07:32:20 PM »
These chat bots have got scarily good :(

Probeman

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Re: Probe Software Company and Product Information
« Reply #16 on: February 26, 2023, 08:47:14 AM »
These chat bots have got scarily good :(

The good news (so far) is that they have no idea what they are talking about!
The only stupid question is the one not asked!

Mike Matthews

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Re: Probe Software Company and Product Information
« Reply #17 on: February 26, 2023, 07:46:04 PM »
So how many of our politicians are actually chatbots and how long has this been going on😱

John Donovan

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Re: Probe Software Company and Product Information
« Reply #18 on: May 13, 2024, 02:36:34 PM »
If you would like to receive invitations to our upcoming Probe Software webinars please click on the link below and subscribe:

https://dashboard.mailerlite.com/forms/732614/121251216423388335/share
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John Donovan

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Re: Probe Software Company and Product Information
« Reply #19 on: June 05, 2024, 08:49:15 AM »
Following up with Julien Allaz's post above we asked Grok (the AI on X.com) the following question:

What are the advantages of electron probe microanalysis?  And Grok responded:

Quote
Electron probe microanalysis (EPMA) is a non-destructive technique that offers several advantages for material characterization. It allows for the determination of the chemical composition of small volumes of a solid material, which is particularly useful for materials science, geoscience, and other fields requiring precise chemical analysis. The primary benefits of EPMA include:

1    Non-destructive analysis: EPMA does not destroy or significantly alter the sample, allowing for further analysis or reuse if needed.
2    High spatial resolution: EPMA can analyze small areas of the sample with a resolution down to a few micrometers, providing detailed information about the chemical composition of different regions within the sample.
3    High sensitivity: EPMA can detect elements in concentrations as low as a few tens of parts per million (ppm), making it suitable for trace element analysis.
4    Simultaneous analysis: EPMA can simultaneously analyze multiple elements in a single measurement, providing a comprehensive understanding of the sample's composition.
5    Quantitative analysis: EPMA can provide quantitative data on the concentration of elements in the sample, allowing for accurate comparisons between different samples or standards.
6    Versatility: EPMA can be applied to a wide range of materials, including metals, alloys, ceramics, minerals, and biological samples.

These advantages make EPMA a powerful tool for researchers and scientists in various fields, providing detailed and accurate information about the chemical composition of their samples.

Then we decided to ask a harder question: How can trace element accuracy and sensitivity be improved in EPMA?  And Grok responded:

Quote
Trace element accuracy and sensitivity in electron probe microanalysis (EPMA) can be improved through various methods and advancements. Here are some strategies based on the information provided:

1    High-brightness electron sources and spectrometers: The use of high-brightness electron sources and spectrometers with high X-ray collection efficiencies can improve the detection limits and analytical capabilities for trace elements.
2    Matrix iterated quantitative blank correction: This technique can help overcome the disadvantages of high detection limits and poor accuracy in trace element analyses by optimizing analytical conditions and making corrections for peak overlap and secondary standard measurements.
3    Advanced software methods: Software tools, such as those provided by Probe Software's Probe for EPMA, can help improve both the accuracy and precision of trace element EPMA analyses through the use of advanced background calibration and correction methods.
4    Ion beam milling and electron counting mode: Using an ion beam to mill the sample and collecting data in electron counting mode with an energy filter can improve the resolution and precision of the analysis.
5    Advanced detectors: The use of advanced detectors, such as the EDX-7200 from Shimadzu, can provide high sensitivity, high speed, and high precision for accurate elemental analysis.
6    Micro-ED data collection in electron counting mode: Collecting Micro-ED data in electron counting mode without a beam stop and using an energy filter can improve the resolution and precision of the analysis.
7    Elemental analysis kits: Utilizing exclusive screening analysis kits for accurate elemental analysis, such as those offered by Shimadzu, can help improve the accuracy and sensitivity of trace element EPMA.
8    Objective and critical examination of sources: For controversial topics or when examining the accuracy and sensitivity of trace element EPMA, it is important to be objective and present views from different perspectives. Examine sources critically and be politically unbiased.
9    Regular updates and advancements in technology: Staying informed about the latest advancements in EPMA technology, such as improved hardware and software, can help improve the accuracy and sensitivity of trace element analyses.
10   Using well-characterized reference samples: The development and use of matrix reference samples with well-characterized trace elements of interest is important for monitoring and improving the accuracy of trace element analyses in EPMA.

By implementing these strategies and utilizing the latest advancements in EPMA technology, researchers can improve the accuracy and sensitivity of trace element analyses in their work.

Interesting that it not only mentioned our "matrix iterated quantitative blank correction", but also it specifically named the Probe for EPMA software!    8)

If you are interested in learning how to improve your trace element EPMA accuracy and sensitivity, see this webinar on our YouTube channel:

https://www.youtube.com/watch?v=9KM5lU403VY&ab_channel=ProbeSoftwareInc
« Last Edit: June 05, 2024, 09:04:32 AM by John Donovan »
John J. Donovan, Pres. 
(541) 343-3400

"Not Absolutely Certain, Yet Reliable"