Author Topic: Using image shift on Jeol 8230/8530  (Read 2817 times)

Ben Buse

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Using image shift on Jeol 8230/8530
« on: November 01, 2016, 08:37:27 AM »
Hi,

With John's help I've started using image shift on our Jeol 8530 to correct for shifts with beam current and kV.

It's easy to set up. In the probewin.ini file ImageShiftPresent must be set to 1.

ImageShiftPresent=1

Then in analytical conditions - type in the amount of x and y shift required.

Checking this against the amount of image shift recorded on the Jeol software - shows that all is good.

e.g. PFE set image shift to X -2um, Y 3 um

Amount of image shift recorded in the Jeol software:
dX=-2.0020um
dY=2.9968um

So to set image shift - Analytical conditions - OK applies to column. One can remove image shift either in Analytical conditions - or on the Jeol software using the SHIFT button.

Ben
« Last Edit: November 01, 2016, 10:03:03 AM by John Donovan »

John Donovan

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Re: Using image shift on Jeol 8230/8530
« Reply #1 on: November 23, 2016, 01:55:59 PM »
Ben Buse found that if one has the JEOL 8230/8530 image shift set to non-zero values, and one switches from scan mode to spot mode, the JEOL EIKS interface throws an error. This behavior is different than 8900/8200 and 8500 instruments. So, for 8x30 instruments we now check for switching from scan mode to spot mode and if so, we set the image shift to 0, 0 before switching beam modes.   This fix is available now for 8230/8530 users in the latest v. 11.7.1 of Probe for EPMA which can be downloaded from the Help menu.

Please note that you will need an updated JEOL driver (v. 2.1.1) for this fix. Please contact Probe Software or one of our microprobe specialists listed here for an updated driver:

http://probesoftware.com/Support.html

john
« Last Edit: November 23, 2016, 10:12:48 PM by John Donovan »
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