Hi all,
I'm a very new DTSA-II user. I'm attempting to quantify STEM EDS spectra collected from FIB-sections of SiC. I've already done this using the Bruker software that came with our detector, but I'd like a bit more control over the quantification to try and resolve some weirdness (non 1:1 ratios of Si to C) I'm seeing in a few samples. In any case, I'm having trouble figuring out how to do a Cliff Lorimer quantification for thin films without any standard spectra. We use theoretical k-factors with the Bruker software, and I've been told our detector and microscope have yielded very reliable data, even for low Z elements like C, in the past using this methodology with our equipment (Nion UltraSTEM with a windowless SDD detector).
My question for the forum is, is DTSA-II able to do standardless quantification of thin films? If so, how do I go about doing that? The great tutorial videos that Nicholas has on YouTube seem more geared towards spectra from thick samples and using standards, unless I've missed something. Thanks in advance!