You could say I'm somewhat surprised this isn't as large an effect as I thought it might be, but still it is an effect we should try to avoid. What am I talking about?
Well, some have argued that one should defocus the beam so that the beam diameter matches the pixel size, but it occurs to others that defocusing the beam will produce a greater probability of acquiring intensities from more than one phase.
So I ran a small (32 x 32 pixel) acquisition of a Cu-Al eutectic allow that consists of a Cu-Al alloy and a relatively pure Al phase, first with a fully focused beam and a second acquisition with an 8 um defocused beam where the acquisition size for both was 256 um x 256 microns (256um/32 = 8um).
The results are attached below, but it is clear that there are somewhat more "edge" pixels in the defocused beam acquisitions. Specifically, the 0 um beam size acquisition shows 44% "edge" pixels, while the 8 um defocused beam acquisition shows 51% "edge" pixels. I suspect the relatively small difference between the two acquisitions is because the beam scan is smoothly scanning across the sample surface so in the sense you are stuck with an acquisition area equal to the pixel size- at least in the scan direction!
Now you might say, ok, we're not surprised. But as I said in the beginning, some people have argued that we should be defocusing our beam for x-ray mapping and I think the data shows we should not unless there is a specific reason for doing so, but I can't think of why unless it is for symmetry...