Microprobe Specialist Biographies:

 

Scott Boroughs

Scott Boroughs has a long history of work with Probe for EPMA on both JEOL and Cameca instruments. He currently manages the EPMA facilities in the GeoAnalytical Laboratory at Washington State University, while at the same time pursuing his own interests which focus on volcanology/petrology, and of course microanalytical methodology (EPMA, LA-ICPMS).

 

Mike Matthews

Mike Matthews has been consulting for Probe Software since 2021. He has been operating EPMA for over 30 years, starting with a Cameca Camebax Microbeam analysing mantle garnets at the University of Edinburgh in 1987. From Edinburgh he spent a year setting up and running the EPMA facility for the analysis arm of Rio Tinto Zinc, Anamet Services near Bristol then moving on to Johnson Matthey’s Technology Centre for the next 13 years, analysing platinum group metal products, including autocatalysts and fuel cells. More recently he completed a PhD on EPMA analysis of radioactive materials as a mature student at the University of Bristol, sponsored by his current employer, AWE plc. He is currently the President of the International Union of Microbeam Analysis Societies (IUMAS), a former President of the European Microbeam Analysis Society (EMAS).

 

Anette von der Handt

Anette von der Handt has been consulting for Probe Software since 2014. She is currently a researcher in the Department of Earth Sciences at the University of Minnesota and manages the Electron Microprobe Laboratory housing a new JEOL JXA-8530FPlus with an SXES detector. She studied Geology at the University of Bonn (Germany) and received her Ph.D. in Geochemistry from the Max-Planck Institute for Chemistry, Germany, followed by a PostDoc at the University of Hawai’i and an assistant professor position in the Department of Mineralogy at the University of Freiburg (Germany). She has worked on a variety of JEOL and Cameca electron microprobes developing micro-analytical methods with a special focus on trace element and ultra-light element (B, C, O, N) analysis as well as the analysis of beam-sensitive materials.

 

Owen Neill

Owen Neill has been consulting for Probe Software since 2015. He received his M.Sc. in Geology & Geophysics from the University of Hawai‘i at Manoa in 2010, and his Ph.D. in Geology from the University of Alaska Fairbanks in 2013.

 

Karsten Goemann

Karsten Goemann has been consulting for Probe Software since 2014. He studied Mineralogy and Geochemistry at Universität Hannover and Technische Universität Clausthal in Germany and received his Dipl.-Min. (MSc in Mineralogy) at TU Clausthal in 1996, and his Dr. rer. nat. (PhD in Natural Sciences) at TU Clausthal in 2000. After a few years as a PostDoc in Materials Science he commenced his current role in 2006 as manager of the Electron Microscopy and X-Ray Microanalysis Facility of the Central Science Laboratory, University of Tasmania, Australia.

 

Gareth Seward

Gareth Seward has been consulting for Probe Software since 2012. He is currently the manager of the Electron Microscopy and Microanalysis Facility in the Department of Earth Science at the University of California, Santa Barbara. He received his B.Sc. in Geological Sciences from the University of Leeds (UK) in 1998, his M.Sc. in Geochemistry from the University of Leeds in 1999 and his Ph.D. in Materials Science from the University of Liverpool (UK) in 2004. From 2003-2005, Gareth was employed as an R&D scientist and Electron Microscopy specialist in the steel industry.

 

Will Nachlas

 

Will Nachlas has been consulting with Probe Software since 2020 and operating electron microprobes since 2008. He completed a BSc in the Department of Geosciences at Virginia Tech in 2010, a PhD from the Department of Earth Sciences at University of Minnesota in 2015, and held a postdoc position in the Department of Earth Sciences at Syracuse University from 2016-2020. Since early 2020 he is Assistant Scientist and Director of Electron Microbeam Labs in the Department of Geoscience, University of Wisconsin-Madison, overseeing Cameca SX-Five FE EPMA, Cameca SX-51 EPMA, and Hitachi VP-SEM instruments.